学術論文
[1] Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Takao Someya, and Takayasu Sakurai, "Suppression of Dc Bias Stress-Induced Degradation of Organic Field-Effect Transistors Using Postannealing Effects," Applied Physics Letters, volume 87, page 073505 2005.
国際会議（一般講演：口頭）
[1] Kenjiro Fukuda, Tsuyoshi Sekitani, and Takao Someya, "Channel Length Dependence of Dc Bias Stress Effect in Organic Field-Effect Transistors at High Temperatures," Tu P22, IEEE Nanotechnology Materials and Devices Conference 2008 (NMDC 2008), October 2008.
[2] Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Yoshiaki Noguchi, Takayasu Sakurai, and Takao Someya, "Organic Field-Effect Transistors with Suppressed Dc Bias-Stress Degradations," 2005 MRS Fall Meeting, #M7.11, page 273 November 2005.