国際会議（一般講演：口頭）
[1] Kenjiro Fukuda, Tsuyoshi Sekitani, and Takao Someya, "Channel Length Dependence of Dc Bias Stress Effect in Organic Field-Effect Transistors at High Temperatures," Tu P22, IEEE Nanotechnology Materials and Devices Conference 2008 (NMDC 2008), October 2008.