T. Sekitani, S. Iba, Y. Kato, T. Someya, and T. Sakurai, "Suppression of Dc Bias Stress-Induced Degradation of Organic Field-Effect Transistors Using Postannealing Effects," Applied Physics Letters, 87, p. 073505 2005.
ID 277
分類 学術論文
タグ bias dc degradation effects field-effect organic postannealing stress-induced suppression transistors
表題 (title) Suppression of Dc Bias Stress-Induced Degradation of Organic Field-Effect Transistors Using Postannealing Effects
表題 (英文)
著者名 (author) Tsuyoshi Sekitani,Shingo Iba,Yusaku Kato,Takao Someya,Takayasu Sakurai
英文著者名 (author) Tsuyoshi Sekitani,Shingo Iba,Yusaku Kato,Takao Someya,Takayasu Sakurai
キー (key) Tsuyoshi Sekitani,Shingo Iba,Yusaku Kato,Takao Someya,Takayasu Sakurai
定期刊行物名 (journal) Applied Physics Letters
定期刊行物名 (英文)
巻数 (volume) 87
号数 (number)
ページ範囲 (pages) 073505
刊行月 (month) 0
出版年 (year) 2005
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) 073505
論文電子ファイル 利用できません.
BiBTeXエントリ
@article{id277,
         title = {Suppression of DC Bias Stress-Induced Degradation of Organic Field-Effect Transistors Using Postannealing Effects},
        author = {Tsuyoshi Sekitani and Shingo Iba and Yusaku Kato and Takao Someya and Takayasu Sakurai},
       journal = {Applied Physics Letters},
        volume = {87},
         pages = {073505},
         month = {0},
          year = {2005},
}