国際会議（一般講演：口頭）
[1] Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Yoshiaki Noguchi, Takayasu Sakurai, and Takao Someya, "Organic Field-Effect Transistors with Suppressed Dc Bias-Stress Degradations," 2005 MRS Fall Meeting, #M7.11, page 273 November 2005.