国際会議（一般講演：口頭）
[1] Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Hiroshi Shinaoka, and Takao Someya, "Bending and Recovery Tests of Organic Field-Effect Transistors," 2004 International Conference on Solid State Devices and Materials (SSDM 2004), #F10-3, pages 876-877 September 2004.
受賞暦
[1] 関谷研究室, "Bending and Recovery Tests of Organic Field-Effect Transistors," International Conference on Solid State Devices and Materials (SSDM) Young Researcher Award（SSDM 実行委員会）, 2005年9月.