国際会議（一般講演：ポスター）
[1] Misaki Inaoka, Shintaro Izumi, Shusuke Yoshimoto, Toshikazu Nezu, Yuki Noda, Teppei Araki, Takafumi Uemura, and Tsuyoshi Sekitani, "A Contact Resistance and Noise Amount Evaluation Method for Wearable Eeg Sensors," The 22nd SANKEN International Symposium The 17th SANKEN Nanotechnology International Symposium Osaka, Japan, January 15th-16th, (2019), January 2019.