| Tweet | |
| K. Fukuda, T. Sekitani, and T. Someya, "Channel Length Dependence of Dc Bias Stress Effect in Organic Field-Effect Transistors at High Temperatures," Tu P22, IEEE Nanotechnology Materials and Devices Conference 2008 (NMDC 2008), October 2008. | |
| ID | 796 |
| 分類 | 国際会議（一般講演：口頭） |
| タグ | bias channel dc dependence effect field-effect high length organic stress temperatures transistors |
| 表題 (title) |
Channel Length Dependence of Dc Bias Stress Effect in Organic Field-Effect Transistors at High Temperatures |
| 表題 (英文) |
|
| 著者名 (author) |
Kenjiro Fukuda, Tsuyoshi Sekitani, Takao Someya |
| 英文著者名 (author) |
Kenjiro Fukuda,Tsuyoshi Sekitani,Takao Someya |
| キー (key) |
Kenjiro Fukuda,Tsuyoshi Sekitani,Takao Someya |
| 定期刊行物名 (journal) |
Tu P22, IEEE Nanotechnology Materials and Devices Conference 2008 (NMDC 2008) |
| 定期刊行物名 (英文) |
|
| 巻数 (volume) |
|
| 号数 (number) |
|
| ページ範囲 (pages) |
|
| 刊行月 (month) |
10 |
| 出版年 (year) |
2008 |
| Impact Factor (JCR) |
|
| URL |
|
| 付加情報 (note) |
|
| 注釈 (annote) |
|
| 内容梗概 (abstract) |
Kyoto University, October 20-22, 2008.
|
| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id796,
title = {Channel Length Dependence of DC Bias Stress Effect in Organic Field-Effect Transistors at High Temperatures},
author = {Kenjiro Fukuda and Tsuyoshi Sekitani and Takao Someya},
journal = {Tu P22, IEEE Nanotechnology Materials and Devices Conference 2008 (NMDC 2008)},
month = {10},
year = {2008},
}
|