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| T. Sekitani, S. Iba, Y. Kato, H. Shinaoka, and T. Someya, "Bending and Recovery Tests of Organic Field-Effect Transistors," 2004 International Conference on Solid State Devices and Materials (SSDM 2004), #F10-3, pp. 876-877 September 2004. | |
| ID | 739 |
| 分類 | 国際会議（一般講演：口頭） |
| タグ | bending field-effect organic recovery tests transistors |
| 表題 (title) |
Bending and Recovery Tests of Organic Field-Effect Transistors |
| 表題 (英文) |
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| 著者名 (author) |
Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Hiroshi Shinaoka, Takao Someya |
| 英文著者名 (author) |
Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Hiroshi Shinaoka, Takao Someya |
| キー (key) |
Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Hiroshi Shinaoka, Takao Someya |
| 定期刊行物名 (journal) |
2004 International Conference on Solid State Devices and Materials (SSDM 2004), #F10-3 |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
876-877 |
| 刊行月 (month) |
9 |
| 出版年 (year) |
2004 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
pp. 876-877, Tower Hall Funabori, Tokyo, September 14-17, 2004.
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id739,
title = {Bending and Recovery Tests of Organic Field-Effect Transistors},
author = {Tsuyoshi Sekitani and Shingo Iba and Yusaku Kato and Hiroshi Shinaoka and Takao Someya},
journal = {2004 International Conference on Solid State Devices and Materials (SSDM 2004), #F10-3},
pages = {876-877},
month = {9},
year = {2004},
}
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