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T. Uemura and T. Sekitani, "Patch-Type Brain Wave Measurement System Using Flexible Electronics," ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018, November 2018. | |
ID | 1104 |
分類 | 国際会議(招待講演) |
タグ | brain electronics flexible measurement patch-type system wave |
表題 (title) |
Patch-Type Brain Wave Measurement System Using Flexible Electronics |
表題 (英文) |
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著者名 (author) |
Takafumi Uemura,Tsuyoshi Sekitani |
英文著者名 (author) |
Takafumi Uemura,Tsuyoshi Sekitani |
キー (key) |
Takafumi Uemura,Tsuyoshi Sekitani |
定期刊行物名 (journal) |
ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018 |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
11 |
出版年 (year) |
2018 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id1104, title = {Patch-Type Brain Wave Measurement System Using Flexible Electronics}, author = {Takafumi Uemura and Tsuyoshi Sekitani}, journal = {ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018}, month = {11}, year = {2018}, } |