T. Hayashi, N. Take, H. Tamura, K. Muraki, T. Sekitani, and T. Someya, "Admittance Study of Lateral Transport in Dntt-Based Mis Capacitors," 1pLP16, The 9th International Thin-Film Transistor Conference, March 2013.
ID 867
分類 国際会議(一般講演:口頭)
タグ admittance capacitors dntt-based lateral mis study transport
表題 (title) Admittance Study of Lateral Transport in Dntt-Based Mis Capacitors
表題 (英文)
著者名 (author) Toshiaki Hayashi,Naoya Take,H. Tamura,Koji Muraki,Tsuyoshi Sekitani,Takao Someya
英文著者名 (author) Toshiaki Hayashi,Naoya Take,H. Tamura,Koji Muraki,Tsuyoshi Sekitani,Takao Someya
キー (key) Toshiaki Hayashi,Naoya Take,H. Tamura,Koji Muraki,Tsuyoshi Sekitani,Takao Someya
定期刊行物名 (journal) 1pLP16, The 9th International Thin-Film Transistor Conference
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 3
出版年 (year) 2013
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract) The University of Tokyo, Japan, March 1-2, 2013
論文電子ファイル 利用できません.
BiBTeXエントリ
@article{id867,
         title = {Admittance Study of Lateral Transport in DNTT-Based MIS Capacitors},
        author = {Toshiaki Hayashi and Naoya Take and H. Tamura and Koji Muraki and Tsuyoshi Sekitani and Takao Someya},
       journal = {1pLP16, The 9th International Thin-Film Transistor Conference},
         month = {3},
          year = {2013},
}