T. Uemura and T. Sekitani, "Patch-Type Brain Wave Measurement System Using Flexible Electronics," ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018, November 2018.
ID 1104
分類 国際会議(招待講演)
タグ brain electronics flexible measurement patch-type system wave
表題 (title) Patch-Type Brain Wave Measurement System Using Flexible Electronics
表題 (英文)
著者名 (author) Takafumi Uemura,Tsuyoshi Sekitani
英文著者名 (author) Takafumi Uemura,Tsuyoshi Sekitani
キー (key) Takafumi Uemura,Tsuyoshi Sekitani
定期刊行物名 (journal) ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 11
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 利用できません.
BiBTeXエントリ
@article{id1104,
         title = {Patch-Type Brain Wave Measurement System Using Flexible Electronics},
        author = {Takafumi Uemura and Tsuyoshi Sekitani},
       journal = {ECUST -OU Symposium 2018 East-China University of Science and Technology, Shanghai, China, 17th Nov., 2018},
         month = {11},
          year = {2018},
}